Learn from NI's CEO, Eric Starkloff, and industry leaders such as GM and Qualcomm about how they are using data, analytics, and automation to rethink the value of test and reach new levels of both product and company performance.
0:00 Countdown & Entrance
16:08 Opening Remarks by Eric Starkloff, NI CEO
23:59 Steve Tarnowsky, Director of Battery Cell Engineering at GM
36:33 Dr. Howard Meyer, AFRL Senior Advisor to Air Force Futures
50:18 NI Software Launches, Kaitlyn Mazzarella
53:06 Michael Trumm, Senior Principal Test Systems Engineer at Stryker Corporation
1:00:38 NI Hardware Innovations, Kaitlyn Mazzarella
1:03:23 Gaurav Verma, Senior Director Of Engineering at Qualcomm
1:11:16 Closing Remarks by Eric Starkloff, NI CEO
Mentioned in this keynote:
* TestScale:
https://bit.ly/3mhzIKp
* ActiveUptime™ Solution:
https://bit.ly/3M2KK0p
* DataStudio Design-to-Test Software:
https://bit.ly/3N6wTrh
* Measurement Software Development Kit (SDK):
https://bit.ly/3aczP6Q
* PXI LCR Meter:
https://bit.ly/3aanIaL
Тэги:
#national_instruments #ni #labview #ActiveUptime #battery_cell_engineering #qualcomm #GM #electric_vehicles #testscale #engineering_software #data_analytics #national_instruments_daq #national_instruments_data_acquisition #national_instruments_software #national_instruments_pxi